Electron Gun: Cold Field Emission (FE) gun.
Resolution:
High Vacuum: 1.5 nm at 15 kV.
Low Voltage: 5.0 nm at 1.0 kV.
Acceleration Voltage: 0.5 kV to 30 kV (0.1 kV steps).
Magnification: 20x to 500,000x.
Specimen Chamber Vacuum:
High Vacuum Mode: < 10^-3Pa.
Specimen Stage:
Type: 5-axis eucentric stage.
Traverse: X: 0 - 100 mm, Y: 0 - 50 mm, Z: 5-30 mm.
Rotation/Tilt: 360° rotation; -5 to +60° tilt.
Detector Systems:
Standard Secondary Electron (SE) detector.
Imaging & Analysis:
Compatible with Energy Dispersive X-ray Spectroscopy (EDS/EDX).
Compatible with Electron Backscatter Diffraction (EBSD).
Image processing tools (e.g., Quartz PCI).
Key Features
Automation: Auto-alignment and auto-focus technology.
Control Interface: PC-based operation - Windows 2000
Hitachi S-4300 Cold Field Emission High Resolution
SKU: 4760-005

