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  • Electron Gun: Cold Field Emission (FE) gun.

  • Resolution:

    • High Vacuum: 1.5 nm at 15 kV.

    • Low Voltage: 5.0 nm at 1.0 kV.

  • Acceleration Voltage: 0.5 kV to 30 kV (0.1 kV steps).

  • Magnification: 20x to 500,000x.

  • Specimen Chamber Vacuum:

    • High Vacuum Mode: < 10^-3Pa.

  • Specimen Stage:

    • Type: 5-axis eucentric stage.

    • Traverse: X: 0 - 100 mm, Y: 0 - 50 mm, Z: 5-30 mm.

    • Rotation/Tilt: 360° rotation; -5 to +60° tilt.

  • Detector Systems:

    • Standard Secondary Electron (SE) detector.

  • Imaging & Analysis:

    • Compatible with Energy Dispersive X-ray Spectroscopy (EDS/EDX).

    • Compatible with Electron Backscatter Diffraction (EBSD).

    • Image processing tools (e.g., Quartz PCI). 


Key Features


  • Automation: Auto-alignment and auto-focus technology.

  • Control Interface: PC-based operation - Windows 2000

Hitachi S-4300 Cold Field Emission High Resolution

SKU: 4760-005
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    Service Electron Micrsocopes

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