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The Hitachi S-3400N is a high-performance, variable pressure Scanning Electron Microscope (SEM) designed for advanced imaging and analysis.


Featuring guaranteed high resolution of 3.0nm (SED image in high vacuum mode at 30kV) and 4.0nm (BSED image in VP mode at 30kV), this SEM supports magnification from 5X to 300,000X. The large chamber accommodates specimens up to 200mm in diameter, with motorized 5-axis eucentric stage for precise sample positioning.


Key features include:

  • High Resolution SEM: 3.0nm in high vacuum, 4.0nm in variable pressure mode

  • Variable Pressure Operation: 6Pa to 270Pa selectable range

  • Advanced Detectors: Everhart-Thornley SE detector, super-thin five-segment BSE detector (compositional, topographic, 3D modes), optional environmental SE detector

  • Automatic Functions: Auto brightness/contrast, focus, stigmator, filament saturation, beam alignment, objective aperture alignment

  • Image Processing: Pseudo color, digital zoom, contrast/brightness adjustment, local contrast, cropping, resizing, gamma control, edge enhancement

  • Data Management: SEM Data File Manager, PCI Image Management System, full annotation, measurement, stereo pair generation, image optimization

  • User-Friendly Operation: Windows-based control, 19” LCD monitor, full knob-set and keyboard, stage memory, image navigator, 3D maintenance videos

  • Safety & Reliability: Rapid start, anti-vibration system, safety interlocks, complete spare parts kit, installation and training included


Ideal for research, materials science, and industrial applications requiring high-resolution SEM imaging and flexible sample handling.


Customers purchasing this system will enjoy a comprehensive package, as the price includes shipping, professional installation, and a one-year warranty exclusively for US customers.


This Hitachi S-3400N Variable Pressure SEM has been thoroughly tested and passes all factory specifications. It meets or exceeds the manufacturer’s standards for performance, resolution, and reliability.


The included one-year warranty covers parts as specified in the Terms and Conditions, ensuring peace of mind for buyers. Additionally, the warranty offers unlimited service calls and one preventive maintenance visit during the coverage period, further supporting reliable operation and long-term performance.


Hitachi S-3400N SEM Specifications


Resolution

  • 3.0nm (SED image, High Vacuum, 30kV)

  • 4.0nm (BSED image, Variable Pressure, 30kV)


Magnification Range

  • 5X to 300,000X


Chamber & Stage

  • Specimen size: up to 200mm diameter

  • X Traverse: 80mm (Type I), 100mm (Type II)

  • Y Traverse: 40mm (Type I), 50mm (Type II)

  • Z Traverse: 5–35mm (Type I), 5–65mm (Type II)

  • Rotation: 360° Continuous

  • Tilt Range: -20° to +90°

  • Max Sample Height: 40mm (Type I), 85mm (Type II)

  • Motorization: Manual, 5-axis eucentric


Detectors

  • SE Detector: Everhart-Thornley

  • BSE Detector: Five-segment solid-state, compositional/topographic/3D modes



Electron Source

  • Pre-centered tungsten hairpin type


Accelerating Voltage

  • 300V to 30kV


Vacuum System

  • Turbomolecular pump: 210 liter/sec

  • Rotary pump: 162 liter/min

  • Variable Pressure Range: 6Pa to 270Pa

  • Chamber pump down time: ~90 seconds


Automatic Functions

  • Brightness/Contrast Control (ABCC)

  • Focus Control (AFC)

  • Stigmator and Focus Control (ASF)

  • Filament Saturation (AFS)

  • Beam Alignment (ABA)

  • Beam Setting (ABS)

  • Objective Aperture Alignment (AAA)

  • Auto Beam Blanking


Display & Imaging

  • 19” LCD monitor

  • Signal mixing (BSE, SE, ESED)

  • Display modes: Standard, Full screen, Real-Time Dual Image

  • Scan modes: TV rate, Fast Scan, Slow Scan, Photo Scan, Reduced Area Scan


Image Saving & Processing

  • Pixel resolutions: 640x480, 1280x960, 2560x1920, 5120x3840

  • Frame integration: 2 to 1024 frames

  • SEM Data File Manager, PCI Image Management System

  • Image formats: BMP, JPG, TIF, GIF, PSD, etc.

  • Pseudo color, digital zoom, contrast/brightness, cropping, resizing, gamma control, edge enhancement


Measurement & Annotation

  • Text, graphics, measurements on live or saved images

  • Data edging, 3D Birds Eye View


Operator Assist

  • Stage memory (Type II): up to 200 positions

  • Move stage to saved positions

  • Image navigator

  • 3D maintenance videos

  • Condition save files

  • Magnification presets


Power & Safety

  • Auto transformer: 100–220V, single-phase, 2.0kVA

  • Safety interlocks

  • Rapid start: 6 minutes from cold start

  • Anti-vibration system

Hitachi S-3400 Variable Pressure SEM Type II Stage

SKU: 4760-002
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